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Synthesis of easily testable circuits in the basis $\{\,\vee,\bar{\vphantom{x}}\,\}$ under single-type constant faults at the outputs of elements
Diskretnaya Matematika, Tome 17 (2005) no. 1, pp. 129-140
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We suggest a method to synthesise easily testable circuits of functional elements over the basis $\{\,\vee,\bar{\vphantom{x}}\,\}$ which realise Boolean functions such that at most $h$ variables occur both with and without negation in their disjunctive normal forms. Constant faults of type $1$ at outputs of elements are allowed. It is proved that a complete test for such circuits is of length at most $h$. This research was supported by the Russian Foundation for Basic Research, grant 02–01–00985; by the program of the President of Russian Federation for supporting leading scientific schools, grant 1087.2003.1; by the program ‘Universities of Russia;’ and by the program of basic research of the Department of Mathematical Sciences ‘Algebraic and Combinatoric Methods of Mathematical Cybernetics.’ 
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Yu. V. Borodina. Synthesis of easily testable circuits in the basis $\{\&,\vee,\bar{\vphantom{x}}\,\}$ under single-type constant faults at the outputs of elements. Diskretnaya Matematika, Tome 17 (2005) no. 1, pp. 129-140. http://geodesic.mathdoc.fr/item/DM_2005_17_1_a9/

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