Synthesis of easily testable circuits in the basis $\{\,\vee,\bar{\vphantom{x}}\,\}$ under single-type constant faults at the outputs of elements
Diskretnaya Matematika, Tome 17 (2005) no. 1, pp. 129-140
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We suggest a method to synthesise easily testable circuits of functional elements
over the basis $\{\,\vee,\bar{\vphantom{x}}\,\}$ which realise Boolean functions
such that at most $h$ variables occur both with and without negation
in their disjunctive normal forms.
Constant faults of type $1$ at outputs of elements are allowed.
It is proved that a complete test for such circuits is of length at most $h$.
This research was supported by the Russian Foundation for Basic Research, grant
02–01–00985; by the program of the President of Russian Federation for supporting
leading scientific schools, grant 1087.2003.1; by the program ‘Universities of
Russia;’ and by the program of basic research of the Department of Mathematical
Sciences ‘Algebraic and Combinatoric Methods of Mathematical Cybernetics.’
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author = {Yu. V. Borodina},
title = {Synthesis of easily testable circuits in the basis $\{\&,\vee,\bar{\vphantom{x}}\,\}$ under single-type constant faults at the outputs of elements},
journal = {Diskretnaya Matematika},
pages = {129--140},
publisher = {mathdoc},
volume = {17},
number = {1},
year = {2005},
language = {ru},
url = {http://geodesic.mathdoc.fr/item/DM_2005_17_1_a9/}
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Yu. V. Borodina. Synthesis of easily testable circuits in the basis $\{\&,\vee,\bar{\vphantom{x}}\,\}$ under single-type constant faults at the outputs of elements. Diskretnaya Matematika, Tome 17 (2005) no. 1, pp. 129-140. http://geodesic.mathdoc.fr/item/DM_2005_17_1_a9/