Geodesic
Circuits that allow short unit diagnostic tests
Diskretnaya Matematika, Tome 1 (1989) no. 3, pp. 263-269

Voir la notice de l'article provenant de la source Math-Net.Ru

We study the possibility of constructing easily testable circuits of functional elements in the basis $\{\,\vee,^-\}$ with single-type constant faults at the inputs and the outputs of the elements. We constructively establish that any Boolean function of $n$ variables can be realized by a circuit that allows a unit diagnostic test whose length with respect to order does not exceed $\sqrt{2^n}$. 
@article{DM_1989_1_3_a6,
     author = {N. P. Red'kin},
     title = {Circuits that allow short unit diagnostic tests},
     journal = {Diskretnaya Matematika},
     pages = {263--269},
     publisher = {mathdoc},
     volume = {1},
     number = {3},
     year = {1989},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DM_1989_1_3_a6/}
}
TY  - JOUR
AU  - N. P. Red'kin
TI  - Circuits that allow short unit diagnostic tests
JO  - Diskretnaya Matematika
PY  - 1989
SP  - 263
EP  - 269
VL  - 1
IS  - 3
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/DM_1989_1_3_a6/
LA  - ru
ID  - DM_1989_1_3_a6
ER  - 
%0 Journal Article
%A N. P. Red'kin
%T Circuits that allow short unit diagnostic tests
%J Diskretnaya Matematika
%D 1989
%P 263-269
%V 1
%N 3
%I mathdoc
%U http://geodesic.mathdoc.fr/item/DM_1989_1_3_a6/
%G ru
%F DM_1989_1_3_a6
N. P. Red'kin. Circuits that allow short unit diagnostic tests. Diskretnaya Matematika, Tome 1 (1989) no. 3, pp. 263-269. http://geodesic.mathdoc.fr/item/DM_1989_1_3_a6/