Geodesic
Circuits that allow short unit diagnostic tests
Diskretnaya Matematika, Tome 1 (1989) no. 3, pp. 71-76
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We study the possibility of constructing easily testable circuits of functional elements in the basis $\{\,\vee,^-\}$ with single-type constant faults at the inputs and the outputs of the elements. We constructively establish that any Boolean function of $n$ variables can be realized by a circuit that allows a unit diagnostic test whose length with respect to order does not exceed $\sqrt{2^n}$. 
@article{DM_1989_1_3_a6,
     author = {N. P. Red'kin},
     title = {Circuits that allow short unit diagnostic tests},
     journal = {Diskretnaya Matematika},
     pages = {71--76},
     year = {1989},
     volume = {1},
     number = {3},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DM_1989_1_3_a6/}
}
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N. P. Red'kin. Circuits that allow short unit diagnostic tests. Diskretnaya Matematika, Tome 1 (1989) no. 3, pp. 71-76. http://geodesic.mathdoc.fr/item/DM_1989_1_3_a6/