Geodesic
Determination of the coefficients of the crystal density single-electron matrix representation from X-ray diffraction data
Doklady Akademii Nauk, Tome 271 (1983) no. 5, pp. 1130-1133 Cet article a éte moissonné depuis la source Math-Net.Ru

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@article{DAN_1983_271_5_a25,
     author = {Yu. V. Alexandrov and V. G. Tsirelson and R. P. Ozerov},
     title = {Determination of the coefficients of the crystal density single-electron matrix representation from {X-ray} diffraction data},
     journal = {Doklady Akademii Nauk},
     pages = {1130--1133},
     year = {1983},
     volume = {271},
     number = {5},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DAN_1983_271_5_a25/}
}
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Yu. V. Alexandrov; V. G. Tsirelson; R. P. Ozerov. Determination of the coefficients of the crystal density single-electron matrix representation from X-ray diffraction data. Doklady Akademii Nauk, Tome 271 (1983) no. 5, pp. 1130-1133. http://geodesic.mathdoc.fr/item/DAN_1983_271_5_a25/