Auger-electronic microanalysis of oxidized lead sulfide polycrystalline layer

A. M. Gaskov; A. A. Gol'denveizer; I. A. Sokolov; V. P. Zlomanov; A. V. Novoselova

Geodesic

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Auger-electronic microanalysis of oxidized lead sulfide polycrystalline layer

A. M. Gaskov ; A. A. Gol'denveizer ; I. A. Sokolov ; V. P. Zlomanov ; A. V. Novoselova

Doklady Akademii Nauk, Tome 269 (1983) no. 3, pp. 607-609.

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@article{DAN_1983_269_3_a21,
     author = {A. M. Gaskov and A. A. Gol'denveizer and I. A. Sokolov and V. P. Zlomanov and A. V. Novoselova},
     title = {Auger-electronic microanalysis of oxidized lead sulfide polycrystalline layer},
     journal = {Doklady Akademii Nauk},
     pages = {607--609},
     publisher = {mathdoc},
     volume = {269},
     number = {3},
     year = {1983},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DAN_1983_269_3_a21/}
}

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JO  - Doklady Akademii Nauk
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A. M. Gaskov; A. A. Gol'denveizer; I. A. Sokolov; V. P. Zlomanov; A. V. Novoselova. Auger-electronic microanalysis of oxidized lead sulfide polycrystalline layer. Doklady Akademii Nauk, Tome 269 (1983) no. 3, pp. 607-609. http://geodesic.mathdoc.fr/item/DAN_1983_269_3_a21/