Geodesic
Electron-microscope study of specificities of the dislocation motion in high-alloyed crystals of silicon
Doklady Akademii Nauk, Tome 229 (1976) no. 5, pp. 1087-1090 Cet article a éte moissonné depuis la source Math-Net.Ru

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@article{DAN_1976_229_5_a14,
     author = {I. E. Bondarenko and V. G. Eremenko and V. I. Nikitenko},
     title = {Electron-microscope study of specificities of the dislocation motion in high-alloyed crystals of silicon},
     journal = {Doklady Akademii Nauk},
     pages = {1087--1090},
     year = {1976},
     volume = {229},
     number = {5},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DAN_1976_229_5_a14/}
}
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I. E. Bondarenko; V. G. Eremenko; V. I. Nikitenko. Electron-microscope study of specificities of the dislocation motion in high-alloyed crystals of silicon. Doklady Akademii Nauk, Tome 229 (1976) no. 5, pp. 1087-1090. http://geodesic.mathdoc.fr/item/DAN_1976_229_5_a14/