Reflection of microvawes from thin film of vanadium dioxide
Čelâbinskij fiziko-matematičeskij žurnal, Tome 7 (2022) no. 1, pp. 123-130

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The reflection of a microwaves from a thin film of vanadium dioxide on a dielectric substrate in the vicinity of the semiconductor-metal phase transition is studied. The frequency dependences of the reflectance at various temperatures in the region of the phase transition are calculated. A dip is found in the frequency dependence of the reflection coefficient, which shifts to lower frequencies during the phase transition.
Keywords: microwaves, vanadium dioxide, phase transition.
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     author = {D. A. Kuzmin and I. V. Bychkov and M. G. Vakhitov and D. S. Klygach},
     title = {Reflection of microvawes from thin film of vanadium dioxide},
     journal = {\v{C}el\^abinskij fiziko-matemati\v{c}eskij \v{z}urnal},
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     publisher = {mathdoc},
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     number = {1},
     year = {2022},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/CHFMJ_2022_7_1_a9/}
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D. A. Kuzmin; I. V. Bychkov; M. G. Vakhitov; D. S. Klygach. Reflection of microvawes from thin film of vanadium dioxide. Čelâbinskij fiziko-matematičeskij žurnal, Tome 7 (2022) no. 1, pp. 123-130. http://geodesic.mathdoc.fr/item/CHFMJ_2022_7_1_a9/