TY  - JOUR
AU  - S. G. Gevorgyan
AU  - S. T. Muradyan
AU  - M. H. Azaryan
AU  - G. H. Karapetyan
TI  - Method for measuring thickness of thin objects with a nanometer resolution, based on the single-layer flat-coil-oscillator method
JO  - Proceedings of the Yerevan State University. Physical and mathematical sciences
PY  - 2010
SP  - 63
EP  - 67
IS  - 3
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/UZERU_2010_3_a8/
LA  - en
ID  - UZERU_2010_3_a8
ER  -