%0 Journal Article
%A S. G. Gevorgyan
%A S. T. Muradyan
%A M. H. Azaryan
%A G. H. Karapetyan
%T Method for measuring thickness of thin objects with a nanometer resolution, based on the single-layer flat-coil-oscillator method
%J Proceedings of the Yerevan State University. Physical and mathematical sciences
%D 2010
%P 63-67
%N 3
%I mathdoc
%U http://geodesic.mathdoc.fr/item/UZERU_2010_3_a8/
%G en
%F UZERU_2010_3_a8