%0 Journal Article
%A S. G. Gevorgyan
%A H. G. Shirinyan
%A G. A. Karapetyan
%A G. S. Gevorgyan
%A A. A. Polyanskii
%T Imaging of the grain structure of thin HTS film by a single-layer flat-coil-oscillator test-method (SFCO-technique)
%J Proceedings of the Yerevan State University. Physical and mathematical sciences
%D 2009
%P 50-54
%N 2
%I mathdoc
%U http://geodesic.mathdoc.fr/item/UZERU_2009_2_a8/
%G en
%F UZERU_2009_2_a8