TY  - JOUR
AU  - A. V. Ankudinov
TI  - On the accuracy of the probe-sample contact stiffness measured by an atomic force microscope
JO  - Nanosistemy: fizika, himiâ, matematika
PY  - 2019
SP  - 642
EP  - 653
VL  - 10
IS  - 6
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/NANO_2019_10_6_a6/
LA  - en
ID  - NANO_2019_10_6_a6
ER  -