%0 Journal Article
%A Yu. N. Karamzin
%A S. V. Polyakov
%A I. V. Popov
%A G. M. Kobel'kov
%A S. G. Kobel'kov
%A Jun Ho Choy
%T Numerical simulation of nucleation and migration voids in interconnects of electrical circuits
%J Matematičeskoe modelirovanie
%D 2007
%P 29-43
%V 19
%N 10
%I mathdoc
%U http://geodesic.mathdoc.fr/item/MM_2007_19_10_a2/
%G ru
%F MM_2007_19_10_a2