%0 Journal Article
%A A. S. Vladimirov
%A R. V. Goldshtejn
%A Yu. V. Zhitnikov
%A M. E. Sarychev
%A D. B. Shirabaikin
%T Modeling electromigration and the void nucleation in thin-film conductors
%J Matematičeskoe modelirovanie
%D 2002
%P 95-108
%V 14
%N 4
%I mathdoc
%U http://geodesic.mathdoc.fr/item/MM_2002_14_4_a7/
%G ru
%F MM_2002_14_4_a7