TY  - JOUR
AU  - M. S. Ladnushkin
TI  - Embedded test and debug system with JTAG interface for CMOS digital IC
JO  - Informacionnye tehnologii i vyčislitelnye sistemy
PY  - 2015
SP  - 22
EP  - 27
IS  - 4
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/ITVS_2015_4_a2/
LA  - ru
ID  - ITVS_2015_4_a2
ER  -