%0 Journal Article
%A Yu. V. Borodina
%T Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs
%J Diskretnaya Matematika
%D 2019
%P 14-19
%V 31
%N 2
%I mathdoc
%U http://geodesic.mathdoc.fr/item/DM_2019_31_2_a1/
%G ru
%F DM_2019_31_2_a1