%0 Journal Article
%A S. K. Likharev
%A E. I. Rau
%A V. P. Trifonenkov
%A A. G. Yagola
%T Microtomography of semiconductor structure in the regime of induced current
%J Doklady Akademii Nauk
%D 1989
%P 840-844
%V 307
%N 4
%I mathdoc
%U http://geodesic.mathdoc.fr/item/DAN_1989_307_4_a16/
%G ru
%F DAN_1989_307_4_a16