TY  - JOUR
AU  - S. M. Gorodetskii
AU  - L. B. Kreinin
TI  - Possible mechanism behind the formation of complex radiation defects in silicon, produced by electronic irradiation
JO  - Doklady Akademii Nauk
PY  - 1968
SP  - 46
EP  - 48
VL  - 181
IS  - 1
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/DAN_1968_181_1_a11/
LA  - ru
ID  - DAN_1968_181_1_a11
ER  -