TY  - JOUR
AU  - V. N. Rozhanskii
AU  - G. V. Berezhkova
TI  - Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
JO  - Doklady Akademii Nauk
PY  - 1964
SP  - 1339
EP  - 1340
VL  - 156
IS  - 6
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/
LA  - ru
ID  - DAN_1964_156_6_a22
ER  -