%0 Journal Article
%A V. N. Rozhanskii
%A G. V. Berezhkova
%T Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
%J Doklady Akademii Nauk
%D 1964
%P 1339-1340
%V 156
%N 6
%I mathdoc
%U http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/
%G ru
%F DAN_1964_156_6_a22