TY  - JOUR
AU  - Yu. M. Volokobinskii
TI  - The influence of electric field on the properties of thin dielectric and semiconductor layers
JO  - Doklady Akademii Nauk
PY  - 1957
SP  - 1023
EP  - 1024
VL  - 113
IS  - 5
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/DAN_1957_113_5_a20/
LA  - ru
ID  - DAN_1957_113_5_a20
ER  -