TY  - JOUR
AU  - Zaremba, Marek B.
TI  - Intelligence in manufacturing systems: the pattern recognition perspective
JO  - Control and Cybernetics
PY  - 2010
SP  - 233
EP  - 258
VL  - 39
IS  - 1
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/CC_2010_39_1_a11/
LA  - en
ID  - CC_2010_39_1_a11
ER  -