TY  - JOUR
AU  - Emily M. Tian
AU  - David J. Wollkind
TI  - A nonlinear stability analysis of pattern formation in thin liquid films
JO  - Interfaces and free boundaries
PY  - 2003
SP  - 1
EP  - 25
VL  - 5
IS  - 1
UR  - http://geodesic.mathdoc.fr/articles/10.4171/ifb/69/
DO  - 10.4171/ifb/69
ID  - 10_4171_ifb_69
ER  -